Synopsys validates a PCIe 6.0 PHY inside a face-to-face 3D stack at 64 GT/s — says it got there by pulling apart an existing 2D test chip


Synopsys has published silicon results for what it calls the first 3D PCIe 6.0 test chip, a 5nm PHY built into a face-to-face stacked package that runs 64 GT/s per lane and up to 128 GB/s across an eight-lane link using PAM4 signaling, with receiver eyes clearing the standard’s bit error rate requirement. The company says it got there by pulling apart an existing 2D PCIe 6.0 test chip, adding through-silicon vias, and redoing circuit design and signoff against 3D process design kits, according to its blog post.

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In monolithic chips, PCIe PHYs sit at the perimeter of the die, right next to the package I/O connections, helping keep traces to the substrate short so attenuation and reflections remain manageable. A 2.5D package preserves that layout by parking the PHYs along the outer edge of the outermost chiplets. Face-to-face hybrid bonding removes the option. The bottom die is flipped so its redistribution layer meets the redistribution layer of the logic die above it, which leaves the PCIe PHYs facing away from the substrate they need to reach. Instead, the signals travel down through vias cut into the silicon.



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